Please use this identifier to cite or link to this item: http://117.252.14.250:8080/jspui/handle/123456789/679
Title: TN-102 : Digital image processing and pattern recognition
Authors: Kumar, Anil
Keywords: Digital Image processing - Pattern recognition
Digital image processing
Remote Sensing Application for Hydrological Studies
Issue Date: 1992
Publisher: National Institute of Hydrology
Series/Report no.: ;TN-102
Abstract: In December 1985 the government of the Netherlands and India agreed on an Indo-Dutch Training Programme on Water Management (WAMATRA). Phase I was concluded in 1986-87 and phase II of WAMATRA was started in August 1990. National Institute of Hydrology was associated along with other institutions in this project in few areas. One of the items was "Remote Sensing Application for Hydrological Studies". International Institute for Aerospace Survey and Earth Sciences, (ITC), The Netherlands; have to impart training to the scientists of National Institute of Hydrology, in the above mentioned area. This technical report is based on training of Shri Anil Kumar, Scientist "B" on "Digital Image Processing and Pattern Recognition". It is a regular course of four month duration, starting generally in middle of February in each year. As per information available at ITC, the course is updated each year in .view of rapid development in image processing, pattern recognition, artificial intelligence and data base systems applicable to integrated (RS+GIS) remote sensing data processing. The main objective of this course was to impart the training about the processing of remote sensing data and to extract information from these data. The training mainly consist of lectures, practicals, interaction, field work and case studies. This report will be useful for the people who need an insight into the actual working of remote sensing data processing for direct involvement in their work environment, i.e. research scientist and teaching staff at university level.
URI: http://117.252.14.250:8080/xmlui/handle/123456789/679
Appears in Collections:Technical Notes

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